This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2016.
Company Filing History:
Years Active: 2016
Title: Richard Cong - Innovator in Test Strip Intensity Recognition
Introduction
Richard Cong is an accomplished inventor based in Pleasanton, CA (US). He has made significant contributions to the field of test strip technology, particularly in the area of intensity recognition. His innovative approach has the potential to enhance the accuracy and efficiency of test strip measurements.
Latest Patents
Richard Cong holds a patent for a method titled "Method for fast test strip intensity recognition." This patent discloses techniques for fast and accurate measuring of test strip intensities. The method involves obtaining an image of a sample line in a test strip along with a plurality of reference lines that have known intensities. It includes determining grayscale values of both the sample line and the reference lines from the image. Furthermore, a standard curve is constructed based on the grayscale values versus the known intensities of the reference lines. Finally, the intensity of the sample line is determined by fitting its grayscale value on the standard curve. Richard Cong has 1 patent to his name.
Career Highlights
Throughout his career, Richard has demonstrated a strong commitment to innovation and excellence in his field. His work has not only contributed to advancements in test strip technology but has also paved the way for future research and development in this area.
Collaborations
Richard Cong has collaborated with notable colleagues, including Ge Cong and Lijun Wu. Their combined expertise has fostered a productive environment for innovation and has led to significant advancements in their respective fields.
Conclusion
Richard Cong is a notable inventor whose work in test strip intensity recognition showcases his innovative spirit and dedication to improving measurement techniques. His contributions are valuable to the field and highlight the importance of continued research and development in technology.