Mountain View, CA, United States of America

Garrett Pickard


Average Co-Inventor Count = 7.5

ph-index = 2

Forward Citations = 13(Granted Patents)


Location History:

  • Mt. View, CA (US) (2010)
  • Mountian View, CA (US) (2014)
  • Mountain View, CA (US) (2011 - 2016)

Company Filing History:


Years Active: 2010-2016

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5 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Garrett Pickard

Introduction

Garrett Pickard is a notable inventor based in Mountain View, California. He has made significant contributions to the field of metrology and electron beam technology, holding a total of five patents. His work focuses on enhancing the precision and efficiency of manufacturing processes through innovative inspection methods.

Latest Patents

One of Garrett's latest patents is titled "Apparatus and method for optical inspection, magnetic field and height mapping." This metrology system is designed to provide visual inspection of a workpiece, create a three-dimensional magnetic field map, and measure height. The system's stage is configured to bring points of interest on the workpiece under the desired tool for measurement. The optical field, magnetic field, and height information can be utilized independently or in conjunction to correlate defects in the manufacturing process of the workpiece.

Another significant patent is the "Sharp scattering angle trap for electron beam apparatus." This invention relates to an electron beam apparatus that includes a source for generating an incident electron beam and an electron lens for focusing the beam onto a substrate surface. The apparatus is designed to interact with surface material, causing secondary emission of scattered electrons. Additionally, it features a device that traps scattered electrons emitted at sharp angles relative to the sample surface plane.

Career Highlights

Garrett has worked with prominent companies in the technology sector, including KLA-Tencor Corporation and KLA-Tencor Technologies Corporation. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in metrology and electron beam technologies.

Collaborations

Throughout his career, Garrett has collaborated with talented individuals such as Rudy Flores Garcia and Ming Lun Yu. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.

Conclusion

Garrett Pickard's contributions to the fields of metrology and electron beam technology exemplify the spirit of innovation. His patents reflect a commitment to improving manufacturing processes and enhancing the precision of measurements. His work continues to influence the industry and inspire future advancements.

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