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For the Inventor, By the Inventor

Tsuchiura, Japan

Eiichi Hazaki

This inventor holds 23 USPTO granted patents, primarily in Defect Inspection Technology. Top assignees: Hitachi, Ltd., Hitachi-High-Technologies Corporation, Hitachi Construction Machinery Co., Ltd.. Active years: 1976-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eiichi Hazaki. Retrieved from https://idiyas.com/inventor/eiichi-hazaki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 23

% Patents Active = 91.3

Average Co-Inventor Count = 3.6

ph-index = 10

Forward Citations = 281(Granted Patents)


Location History:

  • Kashiwa, JA (1976)
  • Shimizu, JP (1984 - 1985)
  • Ibaraki, JP (1984 - 1987)
  • Hitachinaka, JP (2006)
  • Tsuchiura, JP (1988 - 2014)

Company Filing History:

goldMedal12 out of 42,726 
 
Hitachi, Ltd.
 patents
silverMedal8 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
bronzeMedal3 out of 1,508 
 
Hitachi Construction Machinery Co., Ltd.
 patents
4. 1 out of 5 
 
Hitachi High-Technologies Corpoartion
 patents
where one patent can have more than one assignee

Years Active: 1976-2014

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Areas of Expertise:
Defect Inspection
Probe Navigation
Scanning Electron Microscope
Focused Ion Beam
Charged Particle Beam
Piezo-Electric Elements
Surface Analyzer
Scroll Compressor
Hydraulic Pumps
Thrust Bearings
Oil Feeding Devices
23 patents (USPTO):Explore Patents
1. 8638026 - Stage drive device (2014-01-28),
2. 8074293 - Defective product inspection apparatus, probe positioning method and probe moving method (2011-12-06),
3. 7598755 - Probe navigation method and device and defect inspection device (2009-10-06),
4. 7553334 - Defective product inspection apparatus, probe positioning method and probe moving method (2009-06-30),
5. 7372283 - Probe navigation method and device and defect inspection device (2008-05-13),
6. 7297945 - Defective product inspection apparatus, probe positioning method and probe moving method (2007-11-20),
7. 7129727 - Defect inspecting apparatus (2006-10-31),
8. 7071713 - Probe navigation method and device and defect inspection device (2006-07-04),
9. 7015483 - Focused ion beam system (2006-03-21),
10. 6403968 - Scanning electron microscope (2002-06-11),
11. 5393977 - Charged particle beam apparatus and it's operating method (1995-02-28),
12. 5384507 - Method of and device for driving piezo-electric elements and system for (1995-01-24),
13. 5256876 - Scanning tunnel microscope equipped with scanning electron microscope (1993-10-26),
14. 5081353 - Combined scanning electron and scanning tunnelling microscope apparatus (1992-01-14),
15. 5026995 - Particle beam surface analyzer (1991-06-25),

Title: The Innovative Mind of Eiichi Hazaki

Introduction: Eiichi Hazaki, a pioneering inventor hailing from Tsuchiura, Japan, is renowned for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Eiichi Hazaki's latest patents showcase his continuous dedication to pushing the boundaries of technological advancement, with a focus on inventions that revolutionize everyday life.

Career Highlights: Throughout his illustrious career, Eiichi Hazaki has consistently demonstrated a keen eye for identifying gaps in the market and developing innovative solutions to address them. His inventions have not only garnered critical acclaim but have also significantly impacted various industries.

Collaborations: Eiichi Hazaki's collaborative spirit has led to fruitful partnerships with leading companies, research institutions, and universities. These collaborations have been instrumental in bringing his visionary ideas to life and transforming them into tangible products that benefit society.

Conclusion: Eiichi Hazaki's relentless pursuit of innovation and his unwavering commitment to excellence have solidified his position as a trailblazing inventor in the world of technology. His contributions continue to inspire future generations of inventors to think outside the box and create solutions that shape the world we live in.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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