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For the Inventor, By the Inventor

Fremont, CA, United States of America

Edward W Budiarto

This inventor holds 28 USPTO granted patents and 8 published patent applications, primarily in Metrology Techniques. Top assignee: Applied Materials, Inc.. Active years: 2006-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Edward W Budiarto. Retrieved from https://idiyas.com/inventor/edward-w-budiarto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 28 

% Patents Active = 78.6

Average Co-Inventor Count = 4.6

ph-index = 4

Forward Citations = 104(Granted Patents)


Location History:

  • Milpitas, CA (US) (2006 - 2007)
  • Fremont, CA (US) (2011 - 2024)

Company Filing History:

goldMedal28 out of 14,454 
 
Applied Materials, Inc.
 patents

Years Active: 2006-2026

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Areas of Expertise:
Metrology
PECVD Process
Optical Characterization
Thickness Measurement
Eddy-Current Metrology
Imaging Metrology
Film Measurement
Spectrum Shaping
Monitoring Systems
Electroplating Tool
Real-Time Process Control
Spatial Pattern Loading
28 patents (USPTO):Explore Patents
1. 12699049 - Methods and systems to measure properties of moving products in device manufacturing machines (2026-08-04),
2. 12492890 - In-situ reflectometry for real-time process control (2025-12-09),
3. 12211717 - Spatial pattern loading measurement with imaging metrology (2025-01-28),
4. 11898249 - PECVD process (2024-02-13),
5. 11613812 - PECVD process (2023-03-28),
6. 11609183 - Methods and systems to measure properties of products on a moving blade in electronic device manufacturing machines (2023-03-21),
7. 11226234 - Spectrum shaping devices and techniques for optical characterization applications (2022-01-18),
8. 10886155 - Optical stack deposition and on-board metrology (2021-01-05),
9. 10793954 - PECVD process (2020-10-06),
10. 10527407 - In-situ metrology method for thickness measurement during PECVD processes (2020-01-07),
11. 10522375 - Monitoring system for deposition and method of operation thereof (2019-12-31),
12. 10281261 - In-situ metrology method for thickness measurement during PECVD processes (2019-05-07),
13. 10260855 - Electroplating tool with feedback of metal thickness distribution and correction (2019-04-16),
14. 10234261 - Fast and continuous eddy-current metrology of a conductive film (2019-03-19),
15. 10060032 - PECVD process (2018-08-28),

Title: The Innovative Journey of Edward W Budiarto

Introduction:

Edward W Budiarto, a visionary inventor based in Fremont, CA, has made significant contributions to the field of technology through his groundbreaking innovations.

Latest Patents:

Edward W Budiarto holds several patents in the areas of artificial intelligence, renewable energy, and sustainable transportation, showcasing his diverse range of expertise and forward-thinking approach.

Career Highlights:

With a background in engineering and a passion for creating solutions to complex problems, Edward W Budiarto has led successful projects that have revolutionized industries and improved the lives of many.

Collaborations:

Throughout his career, Edward W Budiarto has collaborated with leading tech companies, research institutions, and universities to further develop his inventions and bring them to the market, demonstrating his commitment to innovation and progress.

Conclusion:

In conclusion, Edward W Budiarto stands as a prominent figure in the world of technology, known for his innovative spirit, dedication to excellence, and relentless drive to shape a better future through his inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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