Company Filing History:

4 out of 1,787

Kla Tencor Corporation

Kla-tencor Coporation

patents

4. 1 out of 641

Kla-tencor Technologies Corporation

patents

5. 1 out of 2

Kla-technologies Corporation

patents

Years Active: 2008-2021

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9 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 11120969 - Method and system for charged particle microscopy with improved image beam stabilization and interrogation (2021-09-14),

2. 10861671 - Method and system for focus adjustment of a multi-beam scanning electron microscopy system (2020-12-08),

3. 10643819 - Method and system for charged particle microscopy with improved image beam stabilization and interrogation (2020-05-05),

4. 10460905 - Backscattered electrons (BSE) imaging using multi-beam tools (2019-10-29),

5. 10366862 - Method and system for noise mitigation in a multi-beam scanning electron microscopy system (2019-07-30),

6. 10325753 - Method and system for focus adjustment of a multi-beam scanning electron microscopy system (2019-06-18),

7. 10192716 - Multi-beam dark field imaging (2019-01-29),

8. 7612348 - Transverse magnetic field voltage isolator (2009-11-03),

9. 7394339 - Transverse magnetic field voltage isolator (2008-07-01),

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For the Inventor, By the Inventor

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Location History:

Company Filing History:

Years Active: 2008-2021