Company Filing History:

9 out of 188

Therma-wave, Inc.

patents

3 out of 641

Kla-tencor Technologies Corporation

Years Active: 2003-2015

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13 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9037280 - Computer-implemented methods for performing one or more defect-related functions (2015-05-19),

2. 7570797 - Methods and systems for generating an inspection process for an inspection system (2009-08-04),

3. 7304735 - Broadband wavelength selective filter (2007-12-04),

4. 7227637 - Measurement system with separate optimized beam paths (2007-06-05),

5. 7206125 - Infrared blocking filter for broadband Optical metrology (2007-04-17),

6. 7190460 - Focusing optics for small spot optical metrology (2007-03-13),

7. 7154607 - Flat spectrum illumination source for optical metrology (2006-12-26),

8. 7061614 - Measurement system with separate optimized beam paths (2006-06-13),

9. 7050162 - Optical metrology tool having improved contrast (2006-05-23),

10. 6879449 - Broadband refractive objective for small spot optical metrology (2005-04-12),

11. 6744505 - Compact imaging spectrometer (2004-06-01),

12. 6587282 - Broadband refractive objective for small spot optical metrology (2003-07-01),

13. D475054 - Synchronization cradle for a handheld computer (2003-05-28),

Title: The Innovative Contributions of David Y Wang

Introduction

David Y Wang is a prominent inventor based in Fremont, California, known for his significant contributions to the field of inspection technology. With a total of 13 patents to his name, Wang has developed innovative methods that enhance the efficiency and accuracy of defect analysis in various inspection systems.

Latest Patents

Wang's latest patents include computer-implemented methods for performing one or more defect-related functions. One notable method focuses on identifying noise in inspection data by detecting events in multiple sets of inspection data that fall below a predetermined threshold. Another method involves binning defects into groups based on their characteristics and the sets of inspection data in which they were identified. Additionally, he has developed methods for selecting defects for analysis by considering their proximity to one another and the diversity of their characteristics. His work also includes classifying defects on a specimen using both inspection data and defect review data generated for that specimen. Furthermore, he has created methods and systems for generating an inspection process tailored to an inspection system, which involves determining optimal image acquisition parameters to produce the best inspection data for selected defects.

Career Highlights

Throughout his career, David Y Wang has worked with notable companies such as Therma-Wave, Inc. and KLA-Tencor Technologies Corporation. His experience in these organizations has allowed him to refine his expertise in inspection technologies and contribute to advancements in the field.

Collaborations

Wang has collaborated with esteemed colleagues, including David M Aikens and Lawrence D Rotter, further enhancing the impact of his work in the industry.

Conclusion

David Y Wang's innovative patents and career achievements highlight his significant role in advancing inspection technology. His methods for defect analysis and inspection processes continue to influence the field, showcasing his dedication to innovation and excellence.

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