Kirkland, WA, United States of America

Christopher Richard Hamner

USPTO Granted Patents = 11 

 

Average Co-Inventor Count = 1.9

ph-index = 3

Forward Citations = 20(Granted Patents)


Company Filing History:


Years Active: 2021-2025

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11 patents (USPTO):Explore Patents

Title: **Christopher Richard Hamner: Innovator in Metrology and Measurement Technologies**

Introduction:

Christopher Richard Hamner, an accomplished inventor based in Kirkland, WA, has made noteworthy contributions to the field of metrology with a total of nine patents to his name. His innovative spirit and technical expertise have led to significant advancements in measurement systems, enhancing both precision and efficiency in various applications.

Latest Patents:

Among Hamner's latest inventions are two remarkable patents that highlight his expertise in metrology. The first is a **Metrology System Configured to Illuminate and Measure Apertures of Workpieces**. This system employs both front and back vision components, allowing for precise imaging and measurement of apertures. It features a movement mechanism for aligning components and enhances measurement accuracy by analyzing image stacks captured by a camera.

The second notable patent is a **Measuring Probe with Sensing Coils and Temperature Compensation**. This invention involves a measuring probe equipped with a stylus position detection portion and a temperature-dependent compensation mechanism. By compensating for temperature variations, this probe significantly improves the accuracy of the processed signals, making it a valuable tool in coordinate measuring machines.

Career Highlights:

Christopher is currently associated with Mitutoyo Corporation, a leader in precision measuring instruments. His role involves developing cutting-edge technologies that push the boundaries of current measurement capabilities. His patents reflect his commitment to innovation and his drive to solve complex challenges in the realm of metrology.

Collaborations:

Throughout his career, Hamner has worked alongside talented professionals in the field. Notable collaborators include Scott Allen Harsila and Scott Ellis Hemmings, who have contributed to his projects and the continuous growth of innovative solutions within the industry.

Conclusion:

Christopher Richard Hamner's work exemplifies the spirit of innovation and the importance of precision in measurement. His contributions through patents and collaboration with industry professionals underline his significant impact on the metrology sector. As technologies advance, Hamner's inventions will likely continue to play a critical role in enhancing measurement accuracy and efficiency in various applications.

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