The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

Dec. 22, 2021
Applicant:

Mitutoyo Corporation, Kanagawa-ken, JP;

Inventors:

Dawn Alisa Keehnel, Bothell, WA (US);

Christopher Richard Hamner, Kirkland, WA (US);

Scott Ellis Hemmings, Edmonds, WA (US);

Scott Allen Harsila, Shoreline, WA (US);

Assignee:

Mitutoyo Corporation, Kanagawa-ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/012 (2006.01);
U.S. Cl.
CPC ...
G01B 5/012 (2013.01);
Abstract

A scanning probe for a coordinate measurement machine includes a stylus suspension module, a stylus position detection module, a disruptor configuration, and a signal processing and control circuitry module. The stylus position detection module includes a sensor configuration, which comprises various coils, and a shield configuration that is located around the sensor configuration and comprises electrically conductive material for shielding the sensor configuration. The stylus position detection module is mounted to the stylus suspension module utilizing a module mounting configuration, which enables the relative position of the sensor configuration to be adjusted for alignment during the assembly of the scanning probe.


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