The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
Jun. 27, 2022
Mitutoyo Corporation, Kanagawa-ken, JP;
Christopher Richard Hamner, Kirkland, WA (US);
Mitutoyo Corporation, Kanagawa-ken, JP;
Abstract
A lighting configuration is provided for utilization with a metrology system. The metrology system includes a camera that provides images of a workpiece at different focus positions (e.g., through operation of a variable focal length lens). The lighting configuration includes a plurality of lighting portions which illuminate the workpiece for the imaging. The lighting portions are distributed in an arrangement (e.g., an annular arrangement) in which an imaging lens portion of each lighting portion directs light toward a central volume (e.g., for which illumination in the central volume may be relatively uniform in X, Y and Z axis directions). Each imaging lens portion may include at least two lenses in a telecentric arrangement. Each lighting portion may comprise an optical homogenizer. The camera acquires a stack of images of the workpiece, from which focus curve data may be determined which indicates 3 dimensional positions of surface points on the workpiece.