Hsinchu, Taiwan

Chih-Feng Cheng

This inventor holds 23 USPTO granted patents and 9 published patent applications, primarily in Semiconductor Testing. Top assignees: Global Unichip Corporation, Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2013-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chih-Feng Cheng. Retrieved from https://idiyas.com/inventor/chih-feng-cheng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 23 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 134(Granted Patents)


Location History:

  • Taoyuan, TW (2017 - 2018)
  • Hsinchu, TW (2013 - 2023)

Company Filing History:


Years Active: 2013-2026

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Areas of Expertise:
Chip Storing Device
Probe Card Device
Testing Apparatus
Inspecting Device
Thermal Peak Suppression
IC Chip Test
Testing Equipment
Crack Noise Monitoring
Electronic Device
Heat Dissipation
Burn-In Socket
Damping Component
23 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Chih-Feng Cheng

Introduction: Chih-Feng Cheng is a prominent inventor based in Hsinchu, Taiwan. With a remarkable portfolio comprising 20 patents, Cheng has made significant contributions to the fields of semiconductor technology and testing apparatuses. His innovative mindset and technical expertise have positioned him as a key figure in the industry.

Latest Patents: Among Cheng's latest patents are two standout innovations: the "Probe Card Device and Circuit Protection Assembly Thereof" and the "Testing Apparatus." The probe card device features a sophisticated design that includes a wiring board with multiple contacts, a probe head equipped with conductive probes, and a circuit protection assembly with self-resetting fusing elements. This design is geared towards enhancing the reliability of electrical testing.

The testing apparatus consists of a circuit board, a probe station, and a probe array. It incorporates telescopic probes, which are intricately designed to establish connections with device under test (DUT) solder balls, thereby facilitating efficient and accurate testing processes.

Career Highlights: Chih-Feng Cheng has amassed a wealth of experience during his career, working at esteemed organizations such as Global Unichip Corporation and Taiwan Semiconductor Manufacturing Company. His tenure at these companies has allowed him to cultivate his skills and apply his innovative ideas in practical settings.

Collaborations: Throughout his career, Cheng has collaborated with notable colleagues such as Yu-Min Sun and Chih-Chieh Liao. These partnerships have fostered a collaborative environment, leading to the development of cutting-edge technologies that advance the semiconductor industry.

Conclusion: Chih-Feng Cheng's contributions to innovation through his patents demonstrate his commitment to enhancing semiconductor technology. His work not only signifies personal excellence but also drives forward the capabilities of the testing apparatus landscape. As innovations continue to evolve, Cheng's legacy will inspire future inventors and engineers in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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