Chih-Chieh Liao

Title: Innovations and Achievements of Chih-Chieh Liao

Introduction: Chih-Chieh Liao is a prominent inventor based in Hsinchu, Taiwan, known for his extensive contributions to technology, particularly in the field of semiconductor testing. With a remarkable portfolio of 20 patents, Liao has significantly advanced the functionality and efficiency of testing apparatuses and probe card devices.

Latest Patents: Among his numerous inventions, Liao's latest patents include a innovative probe card device and a circuit protection assembly. The probe card device comprises a wiring board with multiple contacts, a probe head with a probe holder, and a series of conductive probes. The circuit protection assembly incorporates an insulation plate, through holes, and self-resetting fusing elements that interact to manage electric currents effectively. Furthermore, his testing apparatus invention integrates a circuit board, probe station, and probe array, enabling seamless testing of devices under test (DUT). This system showcases intricate designs, such as telescopic probes placed in elongated grooves that ensure precision during testing.

Career Highlights: Liao has made significant contributions during his tenure at well-regarded companies, including Global Unichip Corporation and Taiwan Semiconductor Manufacturing Company Limited. His work in these organizations has solidified his reputation as an innovator in semiconductor technologies.

Collaborations: Throughout his illustrious career, Liao has collaborated with talented colleagues such as Yu-Min Sun and Chih-Feng Cheng. These partnerships have fostered a dynamic environment for innovation and technological advancements in their field.

Conclusion: Chih-Chieh Liao's contributions to patentable innovations reflect his deep commitment to advancing semiconductor testing technologies. With his impressive record of patents and collaborations, Liao remains a key figure in the technological landscape, continually pushing the boundaries of what is possible.