Bryant Mantiply

Title: Innovations of Bryant Mantiply

Introduction

Bryant Mantiply is an accomplished inventor based in Mountain View, CA (US). He holds a total of 4 patents that showcase his expertise in the field of semiconductor technology and imaging systems. His innovative contributions have significantly advanced the methods used in specimen scanning and defect identification.

Latest Patents

One of Mantiply's latest patents is focused on determining focus settings for specimen scans. This patent outlines methods and systems for generating a focus map that defines the best focus values based on the position on a specimen. The process involves using output from pre-focus swaths scanned on the specimen, allowing for precise focus settings during the scanning process. Another notable patent addresses defect-location determination using a correction loop for pixel alignment in semiconductor-wafer image alignment. This method enhances the accuracy of defect identification by performing pre-inspection alignment and utilizing offsets to ensure precise imaging.

Career Highlights

Throughout his career, Mantiply has worked with prominent companies in the technology sector, including Kla Tencor Corporation and Kla Corporation. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in semiconductor inspection systems.

Collaborations

Mantiply has collaborated with notable professionals in his field, including Gary Taan and Bjorn Brauer. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and innovation.

Conclusion

Bryant Mantiply's contributions to the field of semiconductor technology through his patents and collaborations highlight his role as a significant inventor. His work continues to influence advancements in imaging systems and defect identification processes.