Jersey City, NJ, United States of America

Benjamin S Pollack

This inventor holds 80 USPTO granted patents and 20 published patent applications, plus 8 CIPO patents and 54 EPO patents, primarily in Specimen Characterization (CPC class G01N). Top assignee: Siemens Healthcare Diagnostics Gmbh. Active years: 2015-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Benjamin S Pollack. Retrieved from https://idiyas.com/inventor/benjamin-s-pollack

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 80 (Patent Applications = 20)

% Patents Active = 95.0

CIPO Patents = 8

EPO Patents = 54 (Patent Applications = 54)

Average Co-Inventor Count = 2.8

ph-index = 12

Forward Citations = 307(Granted Patents)

Forward Citations (Not Self Cited) = 181(Dec 10, 2025)

Inventors with similar research interests:

Location History:

Budd Lake, NJ (US) (2015 - 2020)
Jersey City, NJ (US) (2018 - 2024)

Company Filing History:

80 out of 757

Siemens Healthcare Diagnostics Gmbh

patents

Years Active: 2015-2026

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Areas of Expertise:

Specimen Characterization

Deep Learning

Diagnostic Imaging

Automated Analysis

Neural Networks

Illumination Calibration

Machine Vision

Training Models

Hyperspectral Imaging

Image Segmentation

Robotic Automation

Defect Detection

80 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12656361 - Automated clinical analyzer system and method (2026-06-16),

2. 12596132 - Methods and apparatus for ascertaining specimen and/or specimen container characteristics (2026-04-07),

3. 12579432 - Methods and apparatus for automated specimen characterization using diagnostic analysis system with continuous performance based training (2026-03-17),

4. 12578352 - Methods and apparatus providing calibration of foreground illumination for sample container characterization (2026-03-17),

5. 12567134 - Apparatus and methods of detecting defects in machine vision systems (2026-03-03),

6. 12566187 - Systems and methods for determining test result accuracies in diagnostic laboratory systems (2026-03-03),

7. 12504435 - Hypothesizing and verification networks and methods for specimen classification (2025-12-23),

8. 12504366 - Diagnostic instruments having multiple illumination sources and methods thereof (2025-12-23),

9. 12498388 - Methods and apparatus for imaging specimens and/or sample containers (2025-12-16),

10. 12475681 - Apparatus and methods of training models of diagnostic analyzers (2025-11-18),

11. 12406753 - Diagnostic laboratory systems and methods of imaging tube assemblies (2025-09-02),

12. 12392790 - Apparatus and methods of identifying tube assembly type (2025-08-19),

13. 12299172 - Methods and apparatus for protecting patient information during characterization of a specimen in an automated diagnostic analysis system (2025-05-13),

14. 12287320 - Methods and apparatus for hashing and retrieval of training images used in HILN determinations of specimens in automated diagnostic analysis systems (2025-04-29),

15. 12254694 - Image-based tube top circle detection with multiple candidates (2025-03-18),

Title: The Innovative Mind of Benjamin S Pollack

Introduction: Benjamin S Pollack is a renowned inventor based in Jersey City, NJ, known for his groundbreaking contributions to various fields.

Latest Patents: Benjamin S Pollack holds several patents in the areas of technology, healthcare, and consumer products, showcasing his diverse range of expertise.

Career Highlights: Throughout his career, Benjamin S Pollack has consistently pushed the boundaries of innovation, with his inventions revolutionizing the way we live and work.

Collaborations: Benjamin S Pollack has collaborated with leading companies, research institutions, and universities to bring his ideas to life, further solidifying his reputation as a visionary inventor.

Conclusion: Benjamin S Pollack's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors worldwide.

Profile summary based on public USPTO records.