The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Mar. 25, 2022
Applicant:

Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);

Inventors:

Rayal Raj Prasad Nalam Venkat, Princeton, NJ (US);

Yao-Jen Chang, Princeton, NJ (US);

Benjamin S. Pollack, Jersey City, NJ (US);

Ankur Kapoor, Plainsboro, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3577 (2014.01); G01N 21/33 (2006.01); G01N 21/359 (2014.01); G01N 33/487 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3577 (2013.01); G01N 21/33 (2013.01); G01N 21/359 (2013.01); G01N 33/487 (2013.01);
Abstract

A method of operating a diagnostic instrument includes illuminating an imaging location of the diagnostic instrument with first light having a first spectrum for a first period and capturing a first image of the imaging location illuminated by the first light. The method further includes illuminating the imaging location of the diagnostic instrument with second light having a second spectrum for a second period, the second spectrum being more destructive to a chemical configured to be received in the diagnostic instrument than the first spectrum; and capturing a second image of the imaging location illuminated by the second light. Other methods and diagnostic instruments are disclosed.


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