The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2025
Filed:
Oct. 22, 2020
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Venkatesh NarasimhaMurthy, Hillsborough, NJ (US);
Vivek Singh, Princeton, NJ (US);
Yao-Jen Chang, Princeton, NJ (US);
Benjamin S. Pollack, Jersey City, NJ (US);
Ankur Kapoor, Plainsboro, NJ (US);
Rayal Raj Prasad Nalam Venkat, Princeton, NJ (US);
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Abstract
A method of characterizing a specimen to be analyzed in an automated diagnostic analysis system provides an HILN classification (hemolysis, icterus, lipemia, normal) of the specimen along with a basis for that determination. The method includes assigning a hash code to each training image of a sample specimen used in the characterization training process. In response to an HILN determination for a test specimen, the method can retrieve via the hash code one or more of the closest matching training images upon which the HILN classification is based. The one or more of the closest matching training images can be displayed alongside of the one or more images of the test specimen. Quality check modules and systems configured to carry out the method are also described, as are other aspects.