The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2026
Filed:
Feb. 02, 2022
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Rayal Raj Prasad Nalam Venkat, Princeton, NJ (US);
Yao-Jen Chang, Princeton, NJ (US);
Benjamin S. Pollack, Jersey City, NJ (US);
Ankur Kapoor, Plainsboro, NJ (US);
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Abstract
Methods of identifying a defect in a machine vision system. Embodiments of the method include providing a first imaging device having a first field of view; moving a reflective tool through the first field of view; capturing a plurality of images of the reflective tool at different locations in the first field of view using the first imaging device; and analyzing at least one of the plurality of images to identify one or more defects in the machine vision system. Systems and apparatus configured to carry out the methods are provided, as are other aspects.