The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Oct. 22, 2020
Applicant:

Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);

Inventors:

Venkatesh Narasimhamurthy, Hillsborough, NJ (US);

Vivek Singh, Princeton, NJ (US);

Yao-Jen Chang, Princeton, NJ (US);

Benjamin S. Pollack, Jersey City, NJ (US);

Ankur Kapoor, Plainsboro, NJ (US);

Rayal Raj Prasad Nalam Venkat, Princeton, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G01N 35/00 (2006.01); G06F 18/2431 (2023.01); G06T 7/00 (2017.01); G06V 10/82 (2022.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G01N 35/00613 (2013.01); G06F 18/2431 (2023.01); G06T 7/0012 (2013.01); G06V 10/82 (2022.01); G06V 20/695 (2022.01); G06T 2207/20081 (2013.01);
Abstract

A method of characterizing a specimen to be analyzed in an automated diagnostic analysis system provides a segmentation determination and/or an HILN (hemolysis, icterus, lipemia, normal) determination of the specimen while providing characterization training updates based on the accuracy and/or confidence in the determinations. The method includes identifying an incorrect or low confidence segmentation or HILN determination, forwarding the incorrect or low confidence determination from the HILN network to a database, and providing one or more training images to the HILN network based on the incorrect or low confidence determination. Quality check modules and systems configured to carry out the method are also described, as are other aspects.


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