The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2026
Filed:
Sep. 07, 2023
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Vivek Singh, Princeton, NJ (US);
Rayal Prasad, Princeton, NJ (US);
Yao-Jen Chang, Princeton, NJ (US);
Venkatesh Narasimhamurthy, Hillsborough, NJ (US);
Mark Edwards, Armonk, NY (US);
Benjamin S. Pollack, Jersey City, NJ (US);
Ankur Kapoor, Plainsboro, NJ (US);
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Abstract
A method of determining the accuracy of a test performed by a diagnostic laboratory system includes obtaining one or more first measurements during a first operation of the test performed by the diagnostic laboratory system. One or more second measurements are obtained during a second operation of the test performed by the diagnostic laboratory system. The first measurements and the second measurements are collectively analyzed using a trained model that calculates an uncertainty score for the test based on learned correlations between the first operation and the second operation. The uncertainty score may be used to determine whether the test results can be relied upon or whether the test should be rerun. Other methods and systems are disclosed.