Portland, OR, United States of America

Aurelien Philippe Jean Maclou Botman

USPTO Granted Patents = 10 

 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Location History:

  • Portland, OR (US) (2014 - 2020)
  • Hillsboro, OR (US) (2018 - 2024)

Company Filing History:


Years Active: 2014-2024

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10 patents (USPTO):Explore Patents

Title: Aurelien Philippe Jean Maclou Botman: Innovator in Particle-Induced X-ray Emission

Introduction

Aurelien Philippe Jean Maclou Botman is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of particle-induced x-ray emission, holding a total of 10 patents. His work focuses on advancing analytical methods and systems that enhance the capabilities of charged particle beam technologies.

Latest Patents

One of his latest patents is titled "Particle-induced x-ray emission (PIXE) using hydrogen and multi-species focused ion beams." This patent describes a practical implementation of PIXE on a focused ion beam apparatus or a dual-beam apparatus that includes both focused-ion beam and scanning microscopy capabilities. The analytical method involves directing and focusing a beam of ions, which includes a mixture of protons and non-hydrogen ions, onto a sample. The kinetic energy of these ions is limited to not greater than 50 kilo-electron-Volts (keV). The method also includes detecting and measuring X-rays emitted from the sample in response to the ion impingement.

Another significant patent is the "Method for alignment of a light beam to a charged particle beam." This patent discloses a method and system for observing and aligning a beam of light within the sample chamber of a charged particle beam (CPB) system, such as an electron microscope or focused ion beam system. The method involves providing an imaging aid inside the sample chamber with a calibration surface. When illuminated by light and simultaneously by a CPB, the intensity of the secondary radiation induced by the CPB varies in regions illuminated by light compared to those with lower light levels. This variation provides an image of the light beam on the calibration surface, which can be used for alignment purposes.

Career Highlights

Aurelien Botman has established himself as a key figure in his field through his innovative patents and contributions to particle beam technologies. His work has not only advanced scientific understanding but has also paved the way for practical applications in various industries.

Collaborations

He has collaborated with notable coworkers such as Steven J Randolph and Milos Toth, contributing to a dynamic and innovative work environment at his company, FEI Company.

Conclusion

Aurelien Philippe Jean Maclou Botman is a distinguished inventor whose work in particle-induced x-ray

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