Company Filing History:

12 out of 164,108

International Business Machines Corporation

patents

3 out of 253

Credence Systems Corporation

patents

Years Active: 1977-2000

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15 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 6154865 - Instruction processing pattern generator controlling an integrated (2000-11-28),

2. 6092225 - Algorithmic pattern generator for integrated circuit tester (2000-07-18),

3. 6009546 - Algorithmic pattern generator (1999-12-28),

4. 5692121 - Recovery unit for mirrored processors (1997-11-25),

5. 5412665 - Parallel operation linear feedback shift register (1995-05-02),

6. 5381421 - Per pin circuit test system having N-bit pin interface providing speed (1995-01-10),

7. 5376849 - High resolution programmable pulse generator employing controllable delay (1994-12-27),

8. 5285453 - Test pattern generator for testing embedded arrays (1994-02-08),

9. 5127011 - Per-pin integrated circuit test system having n-bit interface (1992-06-30),

10. 5097144 - Driver circuit for testing bi-directional transceiver semiconductor (1992-03-17),

11. 4779270 - Apparatus for reducing and maintaining constant overshoot in a high (1988-10-18),

12. 4639919 - Distributed pattern generator (1987-01-27),

13. 4608706 - High-speed programmable timing generator (1986-08-26),

14. 4080720 - High density semiconductor circuit layout (1978-03-28),

15. 4032962 - High density semiconductor integrated circuit layout (1977-06-28),

Title: Algirdas J Gruodis: Innovator in Integrated Circuit Testing

Introduction

Algirdas J Gruodis is a notable inventor based in Wappingers Falls, NY (US). He holds a total of 15 patents that showcase his contributions to the field of integrated circuit testing. His innovative work has significantly impacted the efficiency and functionality of testing processes in the electronics industry.

Latest Patents

Among his latest patents is the "Instruction processing pattern generator controlling an integrated circuit." This invention features a pattern generator for an integrated circuit tester that includes an instruction memory for storing addressable instructions. The instruction processor alters the address input to the instruction memory based on the received instructions, enabling complex program flow between main programs and subroutines. Another significant patent is the "Algorithmic pattern generator for integrated circuit tester." This invention organizes IC tests into cycles and utilizes multiple pattern generators to enhance testing efficiency. The design allows for a frequency of test activities that is four times greater than traditional methods, optimizing the testing process.

Career Highlights

Algirdas has worked with prominent companies such as IBM and Credence Systems Corporation. His experience in these organizations has allowed him to develop and refine his innovative ideas in integrated circuit testing.

Collaborations

Throughout his career, Algirdas has collaborated with notable individuals, including Dale E Hoffman and Philip Theodore Kuglin. These partnerships have contributed to the advancement of technology in the field.

Conclusion

Algirdas J Gruodis is a distinguished inventor whose work in integrated circuit testing has led to significant advancements in the industry. His patents reflect a deep understanding of technology and a commitment to innovation.

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