The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 1995
Filed:
Mar. 05, 1992
John E Dickol, Poughkeepsie, NY (US);
Algirdas J Gruodis, Wappingers Falls, NY (US);
Dale E Hoffman, Fishkill, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, and apparatus for accomplishing the method, for controlling an operation of a test pin of a per-pin semiconductor device test system. The method includes the steps of, during a test cycle, generating a plurality of timing signals, providing a test pattern comprised of M-bits, and decoding the M-bits into one of 2.sup.M first multi-bit control words. In accordance with logical states of bits of the first control word, the method selects specified ones of the timing signals and generates a stimulus signal at a test pin in accordance with the selected specified ones of the timing signals. In accordance with an aspect of the invention, the step of providing provides test patterns at a rate of (x) test patterns per second, the step of generating generates test pin stimulus signals at a rate of (y) stimulus signals per second, and wherein (y)=n(x), where (n) is an integer greater than one.