John E Dickol

Title: John E Dickol: Innovator in Semiconductor Testing Technology

Introduction

John E Dickol is a notable inventor based in Poughkeepsie, NY (US). He has made significant contributions to the field of semiconductor testing technology. With a total of 2 patents, his work has advanced the capabilities of testing systems used in the semiconductor industry.

Latest Patents

John E Dickol's latest patents include a "Per pin circuit test system having N-bit pin interface providing speed" and a "High resolution programmable pulse generator employing controllable delay." The first patent describes a method and apparatus for controlling the operation of a test pin in a per-pin semiconductor device test system. This method involves generating multiple timing signals and providing a test pattern comprised of M-bits, which are decoded into control words to select specific timing signals for generating stimulus signals at a test pin. The second patent focuses on a programmable pulse generator that utilizes high-resolution programmable delay circuits, allowing for modifications to timing on-the-fly within a tester cycle.

Career Highlights

John E Dickol is currently employed at International Business Machines Corporation (IBM). His work at IBM has positioned him as a key player in the development of innovative testing solutions for semiconductor devices. His contributions have been instrumental in enhancing the efficiency and effectiveness of testing processes.

Collaborations

Throughout his career, John has collaborated with notable coworkers such as Algirdas J Gruodis and Dale E Hoffman. These collaborations have fostered an environment of innovation and have led to the successful development of advanced testing technologies.

Conclusion

John E Dickol's contributions to semiconductor testing technology through his patents and work at IBM highlight his role as an influential inventor in the field. His innovative approaches continue to shape the future of semiconductor testing.