The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 1987
Filed:
Dec. 19, 1983
Yi-Hua E Chang, Poughkeepsie, NY (US);
Algirdas J Gruodis, Wappingers Falls, NY (US);
Hans P Muhlfeld, Jr, Highland, NY (US);
Charles W Rodriguez, Bethel, CT (US);
Mark L Shulman, Hyde Park, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An array testing apparatus includes a plurality of pin pattern generators for individually generating serial bit sequences required at each pin of a device under test during the testing operation. The individual pin pattern generators receive starting addresses from one or more programmable controllers and each pin pattern generator then performs a subroutine to repeat basic patterns or combinations of basic patterns as necessary. Both the pin pattern generators and the programmable controllers may include loop logic for obtaining the desired repetition sequences.