This inventor holds 3 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 1976-1987.
Company Filing History:
Years Active: 1976-1987
Title: **Hans P Muhlfeld: Innovator in Testing Technology**
Introduction
Hans P Muhlfeld is a notable inventor based in Highland, NY, with a strong focus on advancing technology in testing apparatuses. With a total of three patents to his name, Muhlfeld has significantly contributed to innovations that enhance the efficacy of circuit testing in integrated circuits.
Latest Patents
Among his latest patents is the **Distributed Pattern Generator**, which introduces an array testing apparatus comprising multiple pin pattern generators. These generators are designed to individually create serial bit sequences necessary for each pin of a device under test during its testing phase. Each generator receives starting addresses from programmable controllers, performing subroutines to repeat basic patterns or combinations as required. Additionally, both the pin pattern generators and programmable controllers utilize loop logic to achieve the needed repetition sequences.
Another significant patent is the **Programmable Chip Tester Having Plural Pin Unit Buffers**. This test system is developed for evaluating circuits within integrated circuit chips. It includes a host computer to oversee the system while various blocks operate in parallel, each with its controller, storage for test programs, and a series of electronic units linked to the pins of the device under test. Crucially, each electronic unit is equipped with independent timing circuitry to ensure precise control of its associated pin, independent of other units.
Career Highlights
Muhlfeld is currently affiliated with International Business Machines Corporation (IBM), where he continues to innovate in the field of testing technology. His work at IBM has allowed him to combine theoretical knowledge with practical application, leading to significant advancements in the industry.
Collaborations
Throughout his career, Hans has collaborated with esteemed colleagues such as Matthew C Graf and Edward H Valentine. These partnerships highlight the interdisciplinary approach taken to achieve breakthroughs in testing technologies, contributing to more efficient and reliable electronic devices.
Conclusion
Hans P Muhlfeld stands out as a key figure in the innovation of testing technologies. His patents demonstrate a commitment to improving testing apparatuses, ensuring that devices under evaluation function at optimal levels. As technology continues to evolve, inventors like Muhlfeld play an essential role in shaping the future of electronic testing, facilitating the development of smarter and more efficient devices.