The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 1985
Filed:
Jul. 16, 1981
Applicant:
Inventors:
Matthew C Graf, Highland, NY (US);
Hans P Muhlfeld, Jr, Highland, NY (US);
Edward H Valentine, Wappingers Falls, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G01R / ;
U.S. Cl.
CPC ...
364900 ; 371 16 ; 371 20 ; 371 27 ; 324 / ; 324 / ; 324 / ; 364481 ; 364490 ;
Abstract
A test system for testing circuits in integrated circuit chips includes a host computer for controlling the test system, and a plurality of blocks operable in parallel and each including a controller, storage for test programs and test data, and plurality of electronic units or pin electronics cards, one unit being associated with one of the pins of a device under test. Each of the electronic units include timing circuitry for timing its associated pin independent of the timing of any other electronics unit.