The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 1997
Filed:
Apr. 30, 1996
Ferenc Miklos Bozso, Peekskill, NY (US);
Yiu-Hing Chan, Poughkeepsie, NY (US);
Philip George Emma, Danbury, CT (US);
Algirdas Joseph Gruodis, Wappinger Falls, NY (US);
David Patrick Hillerud, Poughkeepsie, NY (US);
Scott Barnett Swaney, Catskill, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for making a processor system immune to circuit failure caused by external noise using mirrored processors, and a recovery unit integral with the method, are disclosed. Identical addresses and data information is generated in each of two processors. The data is then partitioned into registers and Error Correction Codes (ECC's) are generated for the data. The address, data, and ECC information for each processor is then interlaced in a data structure. The interlaced structures of each processor are then compared. If the comparison yields no errors, the data is checkpointed in the recovery unit; if an error is detected, a recovery sequence can be initiated after the check-stop operation, whereby the system is restored to the last error-free checkpointing operation.