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For the Inventor, By the Inventor

Tokyo, Japan

Akihiko Sekine

This inventor holds 25 USPTO granted patents and 5 published patent applications and 2 EPO patents, primarily in Optical Inspection Technology. Top assignees: Kabushiki Kaisha Topcon, Kabushiki Kaisha Toshiba, Kyoto University. Active years: 1989-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akihiko Sekine. Retrieved from https://idiyas.com/inventor/akihiko-sekine

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 25 

% Patents Active = 84.0

 

Average Co-Inventor Count = 2.5

ph-index = 8

Forward Citations = 201(Granted Patents)


Location History:

  • Itabashi-ku, JP (2009)
  • Tokyo, JP (1989 - 2014)
  • Inagi, JP (2016)

Company Filing History:

goldMedal24 out of 1,033 
 
Kabushiki Kaisha Topcon
 patents
silverMedal4 out of 53,254 
 
Kabushiki Kaisha Toshiba
 patents
bronzeMedal1 out of 869 
 
Kyoto University
 patents
4. 1 out of 93 
 
The University of Electro-Communications
 patents
5. 1 out of 153 
 
Tokyo Kogaku Kikai Kabushiki Kaisha
 patents
where one patent can have more than one assignee

Years Active: 1989-2016

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Areas of Expertise:
Optical Property Measurement
Fundus Observation
Surface Inspection
Mask Defect Inspection
Axial Eye Length Measurement
Photomask Pattern
Ophthalmic Observation
Laser Beam Scanning
25 patents (USPTO):Explore Patents
1. 9476693 - Optical property measurement apparatus and optical property measurement method (2016-10-25),
2. 9456745 - Fundus observation apparatus and fundus image analyzing apparatus (2016-10-04),
3. 8724870 - Ophthalmic observation apparatus (2014-05-13),
4. 7760349 - Mask-defect inspecting apparatus with movable focusing lens (2010-07-20),
5. 7551273 - Mask defect inspection apparatus (2009-06-23),
6. 7522276 - Pattern inspection method (2009-04-21),
7. 7379176 - Mask defect inspection apparatus (2008-05-27),
8. 7372560 - Pattern inspection apparatus (2008-05-13),
9. 7348585 - Surface inspection apparatus (2008-03-25),
10. 7245366 - Surface inspection method and surface inspection apparatus (2007-07-17),
11. 7154597 - Method for inspecting surface and apparatus for inspecting it (2006-12-26),
12. 6104481 - Surface inspection apparatus (2000-08-15),
13. 6100970 - Apparatus for inspecting slight defects on a photomask pattern (2000-08-08),
14. 5912732 - Surface detecting apparatus (1999-06-15),
15. 5812259 - Method and apparatus for inspecting slight defects in a photomask pattern (1998-09-22),

Title: Akihiko Sekine - Pioneering Inventor from Tokyo, JP

Introduction: Akihiko Sekine is a renowned inventor hailing from Tokyo, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Akihiko Sekine holds several patents in the areas of robotics, artificial intelligence, and renewable energy, showcasing his continuous commitment to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Akihiko Sekine has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant technological breakthroughs.

Collaborations: Throughout his career, Akihiko Sekine has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge sharing.

Conclusion: Akihiko Sekine's relentless pursuit of innovation and his passion for creating technology that positively impacts society solidify his position as a visionary inventor in the global tech landscape.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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