The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2016
Filed:
Jan. 21, 2013
Kyoto University, Kyoto-shi, JP;
Kabushiki Kaisha Topcon, Itabashi-ku, JP;
Akiko Matsumoto, Asaka, JP;
Yugo Kimura, Kyoto, JP;
Masanori Hangai, Kyoto, JP;
Nagahisa Yoshimura, Kyoto, JP;
Tsutomu Kikawa, Adachi-ku, JP;
Akihiko Sekine, Inagi, JP;
KYOTO UNIVERSITY, Kyoto-shi, JP;
KABUSHIKI KAISHA TOPCON, Itabashi-ku, JP;
Abstract
In a fundus observation apparatus, an optical system detects interference light generated by superposing signal light having traveled by way of an eye fundus and reference light having traveled by way of a reference optical path. An image forming part forms a cross sectional image based on detection results of the interference light. A specifying part analyzes the cross sectional image to specify an abnormal region located in the vicinity of central fovea of the eye fundus. The association information generating part calculates the distance between the central fovea and the abnormal region and generates association information in which the direction of the abnormal region relative to the central fovea and the distance are associated with each other. The evaluation information generating part generates evaluation information for evaluating the state of the eye fundus based on the association information.