The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2014

Filed:

Jul. 14, 2010
Applicants:

Akihiko Sekine, Tokyo, JP;

Nobusuke Obata, Tokyo, JP;

Katsuhiro Yamada, Tokyo, JP;

Inventors:

Akihiko Sekine, Tokyo, JP;

Nobusuke Obata, Tokyo, JP;

Katsuhiro Yamada, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 3/14 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ophthalmic observation apparatusperforms an OCT measurement of a fundus Ef to form an OCT image, performs an analytical processing on this OCT image, and outputs examination-results information including the analysis results. The ophthalmic observation apparatusis capable of selectively executing a plurality of operation modes. The ophthalmic observation apparatuspreliminarily stores operation mode information, in which various operational details are associated with each operation mode. When one operation mode is designated, the ophthalmic observation apparatusrefers to the operation mode informationto identify the operational details associated with this operation mode, and controls an optical system, an image forming part, a three-dimensional image forming part, an analytic processor, a display, and/or a printer, etc. based on the identified operational details.


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