Akihiko Ariga

This inventor holds 15 USPTO granted patents, primarily in Semiconductor Manufacturing. Top assignees: Hitachi, Ltd., Renesas Technology Corp.. Active years: 2001-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akihiko Ariga. Retrieved from https://idiyas.com/inventor/akihiko-ariga

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 15

% Patents Active = 60.0

Average Co-Inventor Count = 8.6

ph-index = 6

Forward Citations = 98(Granted Patents)

Location History:

Kodaira, JP (2003)
Musashimurayama, JP (2001 - 2009)

Company Filing History:

Renesas Technology Corp.

patents

Years Active: 2001-2009

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Areas of Expertise:

Semiconductor Device

Manufacturing Method

Probe Test

Burn-In Test

Connection Device

Testing Equipment

Substrate Inspection

Cantilever Probe

Semiconductor Apparatus

Testing System

15 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7541202 - Connection device and test system (2009-06-02),

2. 7285430 - Connection device and test system (2007-10-23),

3. 7198962 - Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step (2007-04-03),

4. 7119362 - Method of manufacturing semiconductor apparatus (2006-10-10),

5. 6759258 - Connection device and test system (2004-07-06),

6. 6573112 - Semiconductor device manufacturing method (2003-06-03),

7. 6566150 - Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step (2003-05-20),

8. 6566149 - Method for manufacturing substrate for inspecting semiconductor device (2003-05-20),

9. 6531327 - Method for manufacturing semiconductor device utilizing semiconductor testing equipment (2003-03-11),

10. 6511857 - Process for manufacturing semiconductor device (2003-01-28),

11. 6507204 - Semiconductor testing equipment with probe formed on a cantilever of a substrate (2003-01-14),

12. 6479305 - Semiconductor device manufacturing method (2002-11-12),

13. 6455335 - Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step (2002-09-24),

14. 6305230 - Connector and probing system (2001-10-23),

15. 6197603 - Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step (2001-03-06),

Title: Akihiko Ariga: Pioneering Inventor from Musashimurayama

Introduction: Akihiko Ariga is a renowned inventor hailing from Musashimurayama, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Akihiko Ariga holds several patents in the areas of electronics, robotics, and sustainable energy solutions, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Akihiko Ariga has worked with leading research institutions and technology companies, consistently pushing the boundaries of what is possible in the world of invention.

Collaborations: Throughout his career, Akihiko Ariga has collaborated with top engineers, scientists, and designers, fostering a culture of innovation and creativity that has led to numerous successful projects and inventions.

Conclusion: Akihiko Ariga's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a trailblazer in the world of invention, inspiring future generations to dream big and think outside the box.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]