The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2003
Filed:
Jan. 12, 2001
Ryuji Kono, Chiyoda, JP;
Makoto Kitano, Tsuchiura, JP;
Hideo Miura, Koshigaya, JP;
Hiroyuki Ota, Tsuchiura, JP;
Yoshishige Endo, Tsuchiura, JP;
Takeshi Harada, Abiko, JP;
Masatoshi Kanamaru, Miho, JP;
Teruhisa Akashi, Ishioka, JP;
Atsushi Hosogane, Iwama, JP;
Akihiko Ariga, Musashimurayama, JP;
Naoto Ban, Sagamihara, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In an electric characteristic testing process corresponding to a process of the semiconductor apparatus manufacturing processes, in order to test a large area of the electrode pad of the body to be tested in a lump, an electric characteristic testing is performed by pressing a testing structure provided with electrically independent projections having a number equal to a number of conductor portions to be tested formed on an area to be tested of a body to be tested to the body to be tested.