For the Inventor, By the Inventor

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Santa Barbara, CA, United States of America

Veeco Metrology, Inc.

USPTO Granted Patents = 3

Trademarks = 16

Forward Citations = 5

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10 inventors (with patents filed for the assignee):

Erik Novak (1 out of 17 patents)

Chanmin Su (1 out of 56 patents)

Rohit Jain (1 out of 16 patents)

4. Dong Chen Chen (1 out of 38 patents)

5. Florin Munteanu (1 out of 8 patents)

6. Sergey Belikov (1 out of 2 patents)

7. Gregory A Dahlen (1 out of 6 patents)

8. G Lawrence Best (1 out of 4 patents)

9. Hao-Chih Liu (1 out of 2 patents)

10. Tianming Bao (1 out of 1 patent)

3 patents: Sort by Forward Citations

1. 8213021 - Interferometric measurement of non-homogeneous multi-material surfaces (2012-07-03),

2. 7865966 - Method and apparatus of automatic scanning probe imaging (2011-01-04),

3. 7578176 - Systems and methods for utilizing scanning probe shape characterization (2009-08-25),

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USPTO Data Jan 1 1976 - Dec 30 2025

3 Patents

#112 in Santa Barbara, CA

#16,426 in California

#72,030 in US

Santa Barbara, CA, United States of America

Veeco Metrology, Inc.

Forward Citations = 5

10 inventors:

Erik Novak (1 out of 17 patents)

Chanmin Su (1 out of 56 patents)

Rohit Jain (1 out of 16 patents)

4. Dong Chen Chen (1 out of 38 patents)

5. Florin Munteanu (1 out of 8 patents)

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