Tucson, AZ, United States of America

G Lawrence Best


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2010-2013

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4 patents (USPTO):

Title: **Innovative Contributions of G Lawrence Best in Surface Measurement Technology**

Introduction

G Lawrence Best, a prominent inventor based in Tucson, AZ, has made significant contributions to the field of surface measurement technology. With a total of four patents to his name, Best has demonstrated his ingenuity and dedication to advancing technological processes, particularly in the realm of interferometric measurement techniques.

Latest Patents

Among his latest patents, Best's innovations include detailed methodologies for interferometric measurement of non-homogeneous multi-material surfaces. These patents provide correction factors for the ALR and PTR parameters of magnetic-head sliders. By calculating effective reflectivity and a corresponding PCOR at each pixel of the air-bearing surface, these advancements help improve the precision and accuracy in measurement techniques. Best's empirical equations relate the absolute value of reflectivity at each pixel of the AlTiC air-bearing surface to modulation. Additionally, his work involves calculating the ratio of AlO and TiC in the AlTiC surface at every pixel, assuming a linear relationship between reflectivity and the theoretical values of each constituent.

Career Highlights

Best has contributed his expertise to several esteemed companies including Bruker Nano GmbH and Veeco Metrology, Inc. His work in these organizations has been pivotal in furthering research and development in the field of metrology and surface science.

Collaborations

Throughout his career, G Lawrence Best has collaborated with notable colleagues such as Dong Chen Chen and Florin Munteanu. These partnerships have facilitated the exchange of innovative ideas and insights, enhancing the scope and impact of their collective work.

Conclusion

G Lawrence Best's patent contributions and collaborative efforts exemplify his role as a significant player in the innovations surrounding surface measurement technologies. His work continues to inspire future advancements and serves as a valuable asset to the engineering and scientific communities.

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