Company Filing History:
Years Active: 2009
Title: Innovations by Tianming Bao in Scanning Probe Microscopy
Introduction
Tianming Bao is an accomplished inventor based in Frisco, TX (US). He has made significant contributions to the field of scanning probe microscopy, particularly in the area of probe tip characterization. His work has implications for improving the accuracy of nanoscale measurements.
Latest Patents
Tianming Bao holds a patent titled "Systems and methods for utilizing scanning probe shape characterization." This patent focuses on inferring the dimensions of a scanning probe microscope's probe tip based on its activity since a characterization procedure was performed. The inferred dimensions can be utilized to correct nanoscale measurements, accounting for changes in the probe's geometry, such as wear. He has 1 patent to his name.
Career Highlights
Tianming Bao is currently employed at Veeco Metrology, Inc., where he continues to advance the field of metrology through innovative solutions. His expertise in scanning probe technology has positioned him as a valuable asset in his organization.
Collaborations
Throughout his career, Tianming has collaborated with notable colleagues, including Hao-Chih Liu and Gregory A Dahlen. These partnerships have fostered a collaborative environment that enhances research and development efforts.
Conclusion
Tianming Bao's contributions to scanning probe microscopy exemplify the importance of innovation in scientific research. His work not only advances technology but also improves the precision of nanoscale measurements.