Sergey Belikov

Title: Innovations by Sergey Belikov

Introduction

Sergey Belikov is an accomplished inventor based in Goleta, California. He holds 2 patents that showcase his expertise in scanning probe technology. His work has significantly contributed to advancements in the field of surface profiling and material characterization.

Latest Patents

One of his latest patents is titled "Scanning probe based apparatus and methods for low-force profiling of sample surfaces and detection and mapping of local mechanical and electromagnetic properties in non-resonant oscillatory mode." This invention relates to a multi-purpose probe-based apparatus and methods for providing images of surface topography. It also includes the detection and quantitative mapping of local mechanical and electromagnetic properties in a non-resonant oscillatory mode. The methods may involve filtering incoming probe signals, which provide time deflection curves used for controlling scanning and collecting data that reflects sample adhesion, stiffness, elastic modulus, and viscoelastic response, as well as electric and magnetic interactions. These methods allow for an adaptive choice of an AFM's deflection set-point, enabling imaging at the contact repulsive force for precise surface profilometry. The non-resonant oscillation brings the tip and sample into intermittent contact, allowing for the selection of a desired deformation model to extract quantitative mechanical properties, including viscoelastic response from deflection curves. Additionally, these methods permit local quantitative measurements of tip-sample current and detection of surface potential, capacitance gradients, and piezoresponse in a non-resonant oscillatory mode. The stable thermal environment reduces apparatus thermal drift and enhances performance.

Another significant patent is the "Method and apparatus of automatic scanning probe imaging." This method involves operating a scanning probe microscope (SPM) to scan a sample while the probe interacts with it, collecting surface data in response to the scanning. The method identifies features of the sample from the surface data and automatically performs a zoom-in scan of the identified feature. This process allows for the quick identification and confirmation of the location of features of interest, such as nano-asperities, facilitating the performance of a directed high-resolution image of the feature.

Career Highlights

Throughout his career, Sergey has worked with notable companies such as NT-MDT Development Inc. and Veeco Metrology, Inc. His contributions to these organizations have been instrumental in advancing scanning probe technology.

Collaborations

Sergey has collaborated with esteemed colleagues, including Serg