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Techinsights Inc.

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USPTO Granted Patents = 18

% Expired Patents = 5.6

CIPO Patents = 1

EPO Patents = 2

Trademarks = 10

Forward Citations = 6

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23 inventors (with patents filed for the assignee):

Christopher Pawlowicz (10 out of 10 patents)

Alexander Sorkin (6 out of 7 patents)

Ian Jones (5 out of 5 patents)

4. Robert K Foster (4 out of 4 patents)

5. Jason Abt (4 out of 16 patents)

6. Heinz Josef Nentwich (4 out of 6 patents)

7. Dale Carlson (3 out of 3 patents)

8. Alexander Krechmer (3 out of 7 patents)

9. Michael William Phaneuf (2 out of 25 patents)

10. Ken Guillaume Lagarec (2 out of 20 patents)

11. Michael Green (2 out of 4 patents)

12. Vladimir Martincevic (1 out of 2 patents)

13. Chris Pawlowicz (1 out of 2 patents)

14. Jason M White (1 out of 2 patents)

15. Spyridon Ntais (1 out of 1 patent)

18 patents: Sort by Forward Citations

1. 12555241 - System and method for image segmentation from sparse particle impingement data (2026-02-17),

2. 12498417 - Contrast-enhancing staining system and method and imaging methods and systems related thereto (2025-12-16),

3. 12176177 - Ion beam chamber fluid delivery apparatus and method and ion beam etcher using same (2024-12-24),

4. 12165840 - Ion beam delayering system and method, topographically enhanced delayered sample produced thereby, and imaging methods and systems related thereto (2024-12-10),

5. 11593545 - Integrated circuit imaging, rendering and layout editing system and method (2023-02-28),

6. 11301988 - Reverse engineering data analysis system, and integrated circuit component data processing tool and method thereof (2022-04-12),

7. 11214874 - Method and system for ion beam delayering of a sample and control thereof (2022-01-04),

8. 11074389 - Integrated circuit imaging, rendering and layout editing system and method (2021-07-27),

9. 10803577 - Reverse engineering data analysis system, and integrated circuit component data processing tool and method thereof (2020-10-13),

10. 10689763 - Method and system for ion beam delayering of a sample and control thereof (2020-06-23),

11. 10550480 - Method and system for ion beam delayering of a sample and control thereof (2020-02-04),

12. 10489545 - Integrated circuit imaging, rendering and layout editing system and method (2019-11-26),

13. 10469777 - Methods, systems and devices relating to distortion correction in imaging devices (2019-11-05),

14. 9915628 - Circuit tracing using a focused ion beam (2018-03-13),

15. 9534299 - Method and system for ion beam delayering of a sample and control thereof (2017-01-03),

Company Overview

TechInsights Inc. is a leading provider of technology and patent intelligence services, specializing in the analysis of semiconductor and electronic device technologies. The company focuses on delivering insights into innovation trends, competitive landscapes, and intellectual property strategies. Based in Ottawa, Canada, TechInsights serves a diverse clientele across various sectors, including telecommunications, consumer electronics, and automotive, helping organizations navigate the complexities of technology development and patent portfolios.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

18 Patents

#57 in Ottawa

#822 in Canada

#34,244 in the World

Techinsights Inc.

Forward Citations = 6

23 inventors:

Christopher Pawlowicz (10 out of 10 patents)

Alexander Sorkin (6 out of 7 patents)

Ian Jones (5 out of 5 patents)

4. Robert K Foster (4 out of 4 patents)

5. Jason Abt (4 out of 16 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Techinsights Inc.. Retrieved from https://idiyas.com/company/techinsights

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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