Ken Guillaume Lagarec

USPTO Granted Patents = 20 (Patent Applications = 3)

CIPO Patents = 2

EPO Patents = 1 (Patent Applications = 3)

Average Co-Inventor Count = 2.5

ph-index = 5

Forward Citations = 99(Granted Patents)

Location History:

Gatineau, CA (2009 - 2013)
Ottawa, CA (2014 - 2024)

Company Filing History:

4. 1 out of 832,680

Other

patents

Years Active: 2009-2025

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20 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12255044 - Fiducial guided cross-sectioning and lamella preparation with tomographic data collection (2025-03-18),

2. 12007344 - Method for cross-section sample preparation (2024-06-11),

3. RE50001 - Method and system for cross-sectioning a sample with a preset thickness or to a target site (2024-06-04),

4. 11923168 - Microscopy imaging method for 3D tomography with predictive drift tracking for multiple charged particle beams (2024-03-05),

5. 11726050 - Method for cross-section sample preparation (2023-08-15),

6. 11462383 - Method and system for iteratively cross-sectioning a sample to correlatively targeted sites (2022-10-04),

7. 11366074 - Method for cross-section sample preparation (2022-06-21),

8. 10886100 - Method and system for cross-sectioning a sample with a preset thickness or to a target site (2021-01-05),

9. 10586680 - Microscopy imaging method and system (2020-03-10),

10. 9915628 - Circuit tracing using a focused ion beam (2018-03-13),

11. 9812290 - Microscopy imaging method and system (2017-11-07),

12. 9633819 - Microscopy imaging method and system (2017-04-25),

13. 9383327 - Circuit tracing using a focused ion beam (2016-07-05),

14. 8791436 - Circuit tracing using a focused ion beam (2014-07-29),

15. 8552406 - Apparatus and method for surface modification using charged particle beams (2013-10-08),

Title: Innovator Spotlight: Ken Guillaume Lagarec

Introduction:

Ken Guillaume Lagarec, a prolific inventor based in Ottawa, Canada, has made significant contributions to the field of charged particle beam systems. With a total of 17 patents to his name, Lagarec is known for his groundbreaking work in microscopy imaging methods and sample preparation techniques.

Latest Patents:

One of Lagarec's latest patents is the "Microscopy imaging method for 3D tomography with predictive drift tracking for multiple charged particle beams." This method addresses drift compensation in charged particle beam systems, offering a solution to mechanical variations, beam deflection shifts, and environmental impacts during imaging processes.

Another notable invention is the "Method for cross-section sample preparation," which introduces a carrier grid with an integrated gas delivery system for use in charged particle beam systems. This innovative approach streamlines the sample preparation process, making it more efficient and precise.

Career Highlights:

Throughout his career, Lagarec has worked with esteemed companies such as Fibics Incorporated and DCG Systems GmbH. His expertise and innovative spirit have been instrumental in driving advancements in microscopy and charged particle beam technologies.

Collaborations:

Lagarec has collaborated with renowned experts in the field, including Michael William Phaneuf and Alexander Krechmer. Together, they have pushed the boundaries of charged particle beam systems and introduced novel techniques for sample preparation and imaging.

Conclusion:

Ken Guillaume Lagarec's pioneering work in microscopy imaging methods and sample preparation techniques has earned him a place of distinction in the field of charged particle beam systems. His inventive solutions to drift compensation and sample preparation challenges continue to shape the future of microscopy technologies.

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