The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2023

Filed:

Jun. 17, 2022
Applicant:

Fibics Incorporated, Ottawa, CA;

Inventors:

Michael William Phaneuf, Ottawa, CA;

Ken Guillaume Lagarec, Ottawa, CA;

Andrew John Murray, Ottawa, CA;

Assignee:

FIBICS INCORPORATED, Ottawa, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/2255 (2018.01); G01N 23/20025 (2018.01); G01N 1/28 (2006.01); H01J 37/20 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2255 (2013.01); G01N 1/286 (2013.01); G01N 23/20025 (2013.01); H01J 37/20 (2013.01); H01J 2237/006 (2013.01); H01J 2237/31745 (2013.01); H01J 2237/31749 (2013.01);
Abstract

A carrier grid with integrated gas delivery system for use in a charged particle beam system (CPB). The carrier grid has a body with an internal reservoir for storing a gas. A post extends from the body with an end for supporting a sample to be operated upon, and an outlet tip extends from the end of the post. A channel extends from the reservoir, through the post and ends in the outlet tip, where the outlet tip seals the stored gas in the body. Cutting the outlet tip near its base, with a focused ion beam (FIB) by example, will open the channel to the CPB chamber, allowing the prestored gas within the reservoir to escape. A FIB or electron beam directed at the junction of the sample positioned near the post will cause deposition and subsequent attachment of the sample to the post in presence of the gas.


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