The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

Nov. 10, 2017
Applicant:

Techinsights Inc., Ottawa, Ontario, CA;

Inventor:

Dale Carlson, Stittsville, CA;

Assignee:

TECHINSIGHTS INC., Ottawa, Ontario, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2018.01); G06F 17/50 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06F 17/5068 (2013.01); G06F 17/5081 (2013.01); G06T 7/0002 (2013.01); G06T 2207/30148 (2013.01);
Abstract

Described are various embodiments of a system and method for verifying extracted integrated circuit (IC) features representative of a source IC and stored in a feature dataset structure. Generally, a set of extracted IC features imaged within a designated IC area is converted into a static tile image. The static tile image is then rendered for visualization as an interactive mapping of the feature dataset structure within the area. Corrections for one or more of the set of extracted IC features are received based on the static tile image and input corrections are executed on the feature dataset structure to produce an updated feature dataset structure.


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