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Goleta, CA, United States of America

Oxford Instruments Asylum Research Inc

USPTO Granted Patents = 23

EPO Patents = 2

Forward Citations = 20

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25 inventors (with patents filed for the assignee):

Roger B Proksch (19 out of 58 patents)

Jason Paul Cleveland (12 out of 53 patents)

Aleksander Labuda (11 out of 11 patents)

4. Jason Bemis (8 out of 10 patents)

5. Deron Walters (6 out of 6 patents)

6. Mario Viani (3 out of 10 patents)

7. Maarten Rutgers (3 out of 10 patents)

8. Jim Hodgson (3 out of 3 patents)

9. Anil Gannepalli (2 out of 4 patents)

10. Roger Callahan (2 out of 8 patents)

11. Frank Stetter (2 out of 2 patents)

12. Ted Limpoco (2 out of 2 patents)

13. David Aue (2 out of 2 patents)

14. Matthew Longmire (1 out of 3 patents)

15. Matthew Klonowski (1 out of 5 patents)

23 patents: Sort by Forward Citations

1. 12298327 - Atomic force microscope (2025-05-13),

2. 12055560 - Automated optimization of AFM light source positioning (2024-08-06),

3. RE49997 - Metrological scanning probe microscope (2024-06-04),

4. 11644478 - Automated optimization of AFM light source positioning (2023-05-09),

5. 11519935 - Atomic force microscope (2022-12-06),

6. 10705114 - Metrological scanning probe microscope (2020-07-07),

7. 10557865 - Quantitative measurements using multiple frequency atomic force microscopy (2020-02-11),

8. 10556793 - Thermal measurements using multiple frequency atomic force microscopy (2020-02-11),

9. 10444258 - AM/FM measurements using multiple frequency atomic force microscopy (2019-10-15),

10. 10416190 - Modular atomic force microscope with environmental controls (2019-09-17),

11. 10338096 - Metrological scanning probe microscope (2019-07-02),

12. 10054612 - Optical beam positioning unit for atomic force microscope (2018-08-21),

13. 9921242 - Automated atomic force microscope and the operation thereof (2018-03-20),

14. 9841436 - AM/FM measurements using multiple frequency of atomic force microscopy (2017-12-12),

15. 9804193 - Metrological scanning probe microscope (2017-10-31),

Oxford Instruments Asylum Research Inc is a leading manufacturer of atomic force microscopes (AFMs) for both research and industrial applications. With a focus on advanced imaging and measurement techniques, the company provides innovative solutions to nanotechnology challenges. Asylum Research AFMs offer unmatched capabilities in a compact design, enabling researchers to explore the nanoscale with precision and accuracy. With a commitment to customer support and a global network of distributors, Oxford Instruments Asylum Research Inc strives to empower scientists and engineers in their pursuit of scientific discovery and technological advancements.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

23 Patents

#26 in

#13,951 in

#26,826 in the World

Goleta, CA, United States of America

Oxford Instruments Asylum Research Inc

Forward Citations = 20

25 inventors:

Roger B Proksch (19 out of 58 patents)

Jason Paul Cleveland (12 out of 53 patents)

Aleksander Labuda (11 out of 11 patents)

4. Jason Bemis (8 out of 10 patents)

5. Deron Walters (6 out of 6 patents)

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