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For the Inventor, By the Inventor

Goleta, CA, United States of America

Oxford Instruments Asylum Research Inc


USPTO Granted Patents = 23

% Expired Patents = 17.4


Forward Citations = 21

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25 inventors (with patents filed for the assignee):

goldMedal Roger B Proksch (19 out of 58 patents)

silverMedal Jason Paul Cleveland (12 out of 53 patents)

bronzeMedal Aleksander Labuda (11 out of 11 patents)

4.  Jason Bemis (8 out of 10 patents)

5.  Deron Walters (6 out of 6 patents)

6.  Mario Viani (3 out of 10 patents)

7.  Maarten Rutgers (3 out of 10 patents)

8.  Jim Hodgson (3 out of 3 patents)

9.  Anil Gannepalli (2 out of 4 patents)

10.  Roger Callahan (2 out of 8 patents)

11.  Frank Stetter (2 out of 2 patents)

12.  Ted Limpoco (2 out of 2 patents)

13.  David Aue (2 out of 2 patents)

14.  Matthew Longmire (1 out of 3 patents)

15.  Matthew Klonowski (1 out of 5 patents)


23 patents:

1. 12298327 - Atomic force microscope (2025-05-13),
2. 12055560 - Automated optimization of AFM light source positioning (2024-08-06),
3. RE49997 - Metrological scanning probe microscope (2024-06-04),
4. 11644478 - Automated optimization of AFM light source positioning (2023-05-09),
5. 11519935 - Atomic force microscope (2022-12-06),
6. 10705114 - Metrological scanning probe microscope (2020-07-07),
7. 10557865 - Quantitative measurements using multiple frequency atomic force microscopy (2020-02-11),
8. 10556793 - Thermal measurements using multiple frequency atomic force microscopy (2020-02-11),
9. 10444258 - AM/FM measurements using multiple frequency atomic force microscopy (2019-10-15),
10. 10416190 - Modular atomic force microscope with environmental controls (2019-09-17),
11. 10338096 - Metrological scanning probe microscope (2019-07-02),
12. 10054612 - Optical beam positioning unit for atomic force microscope (2018-08-21),
13. 9921242 - Automated atomic force microscope and the operation thereof (2018-03-20),
14. 9841436 - AM/FM measurements using multiple frequency of atomic force microscopy (2017-12-12),
15. 9804193 - Metrological scanning probe microscope (2017-10-31),
Company Overview
Oxford Instruments Asylum Research Inc, located in Goleta, CA, specializes in advanced atomic force microscopy (AFM) and related technologies. The company focuses on providing high-performance solutions for nanoscale characterization, enabling researchers in various fields such as materials science, biology, and nanotechnology to gain deeper insights into their samples. With a commitment to innovation, Asylum Research plays a crucial role in advancing scientific understanding and fostering developments in microscopy techniques.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

23 Patents

#23 in

#14,428 in

#27,685 in the World

Goleta, CA (US)
Goleta, CA, United States of America

Oxford Instruments Asylum Research Inc

Forward Citations = 21

25 inventors:

goldMedal Roger B Proksch (19 out of 58 patents)

silverMedal Jason Paul Cleveland (12 out of 53 patents)

bronzeMedal Aleksander Labuda (11 out of 11 patents)

4.  Jason Bemis (8 out of 10 patents)

5.  Deron Walters (6 out of 6 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Oxford Instruments Asylum Research Inc. Retrieved from https://idiyas.com/company/oxford-instruments-asylum-research

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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