Company Filing History:
Years Active: 2016-2018
Title: Frank Stetter: Innovator in Atomic Force Microscopy
Introduction
Frank Stetter is a notable inventor based in Garching, Germany. He has made significant contributions to the field of atomic force microscopy, holding two patents that enhance the functionality and efficiency of scanning probe microscopes. His work is instrumental in advancing measurement techniques that are crucial for various scientific applications.
Latest Patents
Stetter's latest patents focus on an automated atomic force microscope and the operation thereof. These patents disclose improvements for rapidly calibrating and automatically operating a scanning probe microscope. A central component of the scanning probe microscope (SPM) is the force transducer, typically a consumable cantilever element. By automatically calibrating transducer characteristics along with other instrumental parameters, scanning parameters can be rapidly and easily optimized. This results in high-throughput, repeatable, and accurate measurements. In contrast to dynamic optimization schemes, this can be accomplished before the surface is contacted, thereby avoiding tip or sample damage from the beginning of the measurement process.
Career Highlights
Frank Stetter is currently associated with Oxford Instruments Asylum Research Inc., where he continues to innovate and develop advanced microscopy techniques. His work has significantly impacted the field, making it easier for researchers to obtain precise measurements without compromising the integrity of their samples.
Collaborations
Some of his notable coworkers include Roger B Proksch and Roger Callahan. Their collaborative efforts contribute to the ongoing advancements in atomic force microscopy and related technologies.
Conclusion
Frank Stetter's contributions to atomic force microscopy through his patents and work at Oxford Instruments Asylum Research Inc. highlight his role as a key innovator in the field. His advancements facilitate more efficient and accurate scientific measurements, benefiting researchers worldwide.