Anil Gannepalli

Title: Anil Gannepalli: Innovator in Thermal Measurement Technologies

Introduction

Anil Gannepalli, based in Golsta, California, is an accomplished inventor with a portfolio of four patents. His work primarily focuses on advancing thermal measurement techniques using atomic force microscopy, contributing significantly to the field of microelectromechanical systems (MEMS).

Latest Patents

Anil Gannepalli's latest research highlights his innovative approach to thermal measurements utilizing multiple frequency atomic force microscopy. His patents describe apparatus and techniques designed for extracting information carried in higher eigenmodes or harmonics of oscillating cantilevers or other oscillating sensors in atomic force microscopy. Additionally, he outlines similar techniques for extracting information from various materials, including piezoelectric and polymer substances through contact resonance using multiple excitation signals.

Career Highlights

Throughout his career, Anil has worked with esteemed organizations such as Oxford Instruments and Asylum Research Incorporated, where he has honed his expertise in nanotechnology and microscopy. His work is characterized by a blend of theoretical knowledge and practical application, leading to innovations that push the boundaries of modern research in material characterization.

Collaborations

Anil Gannepalli has collaborated with notable professionals in his field, including Roger B Proksch and Mario Viani. These collaborations have facilitated a rich exchange of ideas, leading to advancements in the technologies he has developed.

Conclusion

Anil Gannepalli's contributions to the field of thermal measurement and atomic force microscopy showcase his dedication to innovation. With a solid foundation in both practical and theoretical aspects, his work continues to influence the realm of microfabrication and materials science, marking him as a valuable inventor in today’s technological landscape.