Oxford Instruments Asylum Research Inc

Oxford Instruments, Inc.

Asylum Research Corporation

Oxford Instruments Afm Inc

Anil Gannepalli

Roger B Proksch

Jason Paul Cleveland

Mario Viani

Maarten Rutgers

James A Hodgson

Matthew Klonowski

Daren Walters

Jonathan Hensel

Paul Costales

Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work are described. Similar apparatus and techniques for extracting information from piezoelectric, polymer and other materials using contact resonance with multiple excitation signals are also described.

Thermal measurements using multiple frequency atomic force microscopy

A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument. All these modules and many of their subassemblies are replaceable and potentially upgradeable. This allows updating to new technology as it becomes available.

Modular atomic force microscope

Growing community of inventors

Golsta, CA, United States of America

Anil Gannepalli