For the Inventor, By the Inventor

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Pleasanton, CA, United States of America

Oxford Instruments Afm Inc

USPTO Granted Patents = 15

% Expired Patents = 53.3

Forward Citations = 30

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14 inventors (with patents filed for the assignee):

Roger B Proksch (12 out of 58 patents)

Dan Bocek (7 out of 25 patents)

Jason Paul Cleveland (6 out of 53 patents)

4. Roger Callahan (3 out of 8 patents)

5. Mario Viani (2 out of 10 patents)

6. Matthew Longmire (2 out of 3 patents)

7. Matthew Klonowski (2 out of 5 patents)

8. Todd Day (2 out of 7 patents)

9. Clint Callahan (2 out of 6 patents)

10. Anil Gannepalli (1 out of 4 patents)

11. Jason Bemis (1 out of 10 patents)

12. Flavio Alejandro Bonilla (1 out of 3 patents)

13. Tim Sauter (1 out of 3 patents)

14. Roger Carlos Proksch (1 out of 1 patent)

15 patents: Sort by Forward Citations

1. 10337890 - Integrated micro actuator and LVDT for high precision position measurements (2019-07-02),

2. 10215773 - Material property measurements using multiple frequency atomic force microscopy (2019-02-26),

3. 9696342 - Quantitative measurements using multiple frequency atomic force microscopy (2017-07-04),

4. 9689890 - Fully digitally controller for cantilever-based instruments (2017-06-27),

5. 9528859 - Transducer assembly with digitally created signals (2016-12-27),

6. 9366693 - Variable density scanning (2016-06-14),

7. 9069007 - Multiple frequency atomic force microscopy (2015-06-30),

8. 9063042 - Nanoindenter (2015-06-23),

9. 9024623 - Transducer assembly with digitally created signals (2015-05-05),

10. 8925376 - Fully digitally controller for cantilever-based instruments (2015-01-06),

11. 8677809 - Thermal measurements using multiple frequency atomic force microscopy (2014-03-25),

12. 8502525 - Integrated micro actuator and IVDT for high precision position measurements (2013-08-06),

13. 8489356 - Variable density scanning (2013-07-16),

14. 8459102 - Digital Q control for enhanced measurement capability in cantilever-based instruments (2013-06-11),

15. 8448501 - Multiple frequency atomic force microscopy (2013-05-28),

Oxford Instruments AFM Inc. is a leading manufacturer of atomic force microscopes (AFMs), offering innovative solutions for nanoscale imaging, analysis, and manipulation. With a commitment to advancing scientific research and enabling technological advancements, Oxford Instruments AFM Inc. delivers high-resolution and versatile AFM systems to a wide range of industries, including materials science, life sciences, and semiconductor research. Visit our website to explore our cutting-edge AFM solutions and learn how they can revolutionize your nanoscale research.

Profile summary based on public USPTO records.

Company Badge

USPTO Data Jan 1 1976 - Sep 29 2026

15 Patents

#42 in Pleasanton, CA

#5,020 in California

#21,026 in US

#39,846 in the World

Pleasanton, CA, United States of America

Oxford Instruments Afm Inc

Forward Citations = 30

14 inventors:

Roger B Proksch (12 out of 58 patents)

Dan Bocek (7 out of 25 patents)

Jason Paul Cleveland (6 out of 53 patents)

4. Roger Callahan (3 out of 8 patents)

5. Mario Viani (2 out of 10 patents)

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