For the Inventor, By the Inventor

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Pleasanton, CA, United States of America

Oxford Instruments Afm Inc

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USPTO Granted Patents = 15

% Expired Patents = 53.3

Forward Citations = 30

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14 inventors (with patents filed for the assignee):

Roger B Proksch (12 out of 58 patents)

Dan Bocek (7 out of 25 patents)

Jason Paul Cleveland (6 out of 53 patents)

4. Roger Callahan (3 out of 8 patents)

5. Mario Viani (2 out of 10 patents)

6. Matthew Longmire (2 out of 3 patents)

7. Matthew Klonowski (2 out of 5 patents)

8. Todd Day (2 out of 7 patents)

9. Clint Callahan (2 out of 6 patents)

10. Anil Gannepalli (1 out of 4 patents)

11. Jason Bemis (1 out of 10 patents)

12. Flavio Alejandro Bonilla (1 out of 3 patents)

13. Tim Sauter (1 out of 3 patents)

14. Roger Carlos Proksch (1 out of 1 patent)

15 patents: Sort by Forward Citations

1. 10337890 - Integrated micro actuator and LVDT for high precision position measurements (2019-07-02),

2. 10215773 - Material property measurements using multiple frequency atomic force microscopy (2019-02-26),

3. 9696342 - Quantitative measurements using multiple frequency atomic force microscopy (2017-07-04),

4. 9689890 - Fully digitally controller for cantilever-based instruments (2017-06-27),

5. 9528859 - Transducer assembly with digitally created signals (2016-12-27),

6. 9366693 - Variable density scanning (2016-06-14),

7. 9069007 - Multiple frequency atomic force microscopy (2015-06-30),

8. 9063042 - Nanoindenter (2015-06-23),

9. 9024623 - Transducer assembly with digitally created signals (2015-05-05),

10. 8925376 - Fully digitally controller for cantilever-based instruments (2015-01-06),

11. 8677809 - Thermal measurements using multiple frequency atomic force microscopy (2014-03-25),

12. 8502525 - Integrated micro actuator and IVDT for high precision position measurements (2013-08-06),

13. 8489356 - Variable density scanning (2013-07-16),

14. 8459102 - Digital Q control for enhanced measurement capability in cantilever-based instruments (2013-06-11),

15. 8448501 - Multiple frequency atomic force microscopy (2013-05-28),

Company Overview

Oxford Instruments AFM Inc, based in Pleasanton, CA, specializes in advanced scientific instrumentation, particularly in the field of atomic force microscopy (AFM). The company develops innovative solutions that enable high-resolution imaging and analysis at the nanoscale, catering to a diverse range of industries including materials science, life sciences, and nanotechnology. With a commitment to precision and quality, Oxford Instruments AFM Inc plays a crucial role in advancing research and development across various scientific domains.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 10 2026

15 Patents

#42 in Pleasanton, CA

#5,049 in California

#21,119 in US

#40,063 in the World

Pleasanton, CA, United States of America

Oxford Instruments Afm Inc

Forward Citations = 30

14 inventors:

Roger B Proksch (12 out of 58 patents)

Dan Bocek (7 out of 25 patents)

Jason Paul Cleveland (6 out of 53 patents)

4. Roger Callahan (3 out of 8 patents)

5. Mario Viani (2 out of 10 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Oxford Instruments Afm Inc. Retrieved from https://idiyas.com/company/oxford-instruments-afm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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