The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2015
Filed:
May. 28, 2013
Applicants:
Oxford Instruments Afm Inc, Pleasanton, CA (US);
Oxford Instruments Plc, Oxfordshire, GB;
Inventor:
Roger B. Proksch, Santa Barbara, CA (US);
Assignees:
Oxford Instruments PLC, Oxfordshire, GB;
Oxford Instruments AFM Inc, Pleasanton, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/24 (2010.01); G01Q 60/32 (2010.01); B82Y 35/00 (2011.01);
U.S. Cl.
CPC ...
G01Q 60/24 (2013.01); B82Y 35/00 (2013.01); G01Q 60/32 (2013.01);
Abstract
An apparatus and technique for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work is described.
Proksch, Roger. (2015). Multiple frequency atomic force microscopy (U.S. Patent No. 9069007). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9069007
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile