The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2015
Filed:
Jun. 12, 2012
Applicants:
Flavio Alejandro Bonilla, Santa Barbara, CA (US);
Roger Proksch, Santa Barbara, CA (US);
Jason Cleveland, Ventura, CA (US);
Tim Sauter, Santa Barbara, CA (US);
Inventors:
Flavio Alejandro Bonilla, Santa Barbara, CA (US);
Roger Proksch, Santa Barbara, CA (US);
Jason Cleveland, Ventura, CA (US);
Tim Sauter, Santa Barbara, CA (US);
Assignees:
Oxford Instruments PLC, Oxfordshire, GB;
Oxford Instruments AFM Inc, Pleasanton, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 20/02 (2010.01); G01Q 60/36 (2010.01); G01N 3/317 (2006.01); B82Y 35/00 (2011.01);
U.S. Cl.
CPC ...
G01N 3/317 (2013.01); B82Y 35/00 (2013.01); G01N 2203/0078 (2013.01); G01Q 60/366 (2013.01);
Abstract
A new type of indenter is described. This device combines certain sensing and structural elements of atomic force microscopy with a module designed for the use of indentation probes, conventional diamond and otherwise, as well as unconventional designs, to produce high resolution and otherwise superior indentation measurements.