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Otsuka Electronics Co., Ltd.

USPTO Granted Patents = 83

% Expired Patents = 41.0

EPO Patents = 16

Trademarks = 5

Forward Citations = 497

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87 inventors (with patents filed for the assignee):

Kazuaki Ohkubo (13 out of 13 patents)

Tsutomu Mizuguchi (11 out of 11 patents)

Koichi Oka (10 out of 10 patents)

4. Hisashi Shiraiwa (9 out of 9 patents)

5. Kunikazu Taguchi (7 out of 7 patents)

6. Hiroyuki Sano (7 out of 7 patents)

7. Ikuo Wakayama (6 out of 6 patents)

8. Yoshihiro Osawa (6 out of 6 patents)

9. Yoshi Enami (6 out of 6 patents)

10. Nobuyuki Inoue (5 out of 5 patents)

11. Makoto Okawauchi (5 out of 5 patents)

12. Hiroya Nagasawa (5 out of 5 patents)

13. Shiro Kawaguchi (4 out of 5 patents)

14. Tamotsu Hamao (4 out of 8 patents)

15. Kazunori Tsutsui (4 out of 8 patents)

Core Competencies:

Optical Measurement

Photodynamic Therapy

Particle Size Analysis

Zeta-Potential Measurement

Spectrophotometer

Light Scattering

Quantum Efficiency

Film Thickness

Sample Analyzer

Calibration Method

Differential Refractometer

Photon Correlator

83 patents: Sort by Forward Citations

1. 12496388 - Photodynamic therapy device comprising cooling water circulation unit for blood (2025-12-16),

2. 12433987 - Photodynamic therapy device (2025-10-07),

3. 12411108 - Zeta-potential measurement jig set (2025-09-09),

4. 12174103 - Light scattering measuring apparatus and measuring jig (2024-12-24),

5. 12111146 - Optical measurement apparatus and optical measurement method (2024-10-08),

6. 12023429 - Photodynamic therapy device and photodynamic therapy device cartridge (2024-07-02),

7. 11953465 - Zeta-potential measurement jig (2024-04-09),

8. 11892281 - Optical measurement system, optical measurement method, and non-transitory storage medium having measurement program stored thereon (2024-02-06),

9. 11598713 - Particle size measurement method, particle size measurement apparatus, and particle size measurement program (2023-03-07),

10. D962096 - Sample analyzer (2022-08-30),

11. 11293750 - Film thickness measuring apparatus and film thickness measuring method (2022-04-05),

12. 11215443 - Optical measurement apparatus and optical measurement method (2022-01-04),

13. 10996106 - Luminous body measurement apparatus and luminous body measurement method comprising a control unit to pivot a first and a second arm to hold an image pickup device in plural postures (2021-05-04),

14. 10795067 - Confocal optical system-based measurement apparatus and method for manufacturing confocal optical system-based measurement apparatus (2020-10-06),

15. 10788412 - Optical measurement apparatus, and optical measurement method (2020-09-29),

Company Overview

Otsuka Electronics Co., Ltd., based in Osaka, Japan, specializes in advanced optical measurement technologies. The company focuses on developing innovative solutions in photodynamic therapy, particle size analysis, and zeta-potential measurement. Its expertise extends to spectrophotometry, light scattering techniques, quantum efficiency assessments, and film thickness measurements. Otsuka Electronics is committed to enhancing measurement accuracy and reliability across various applications, contributing significantly to scientific research and industrial processes.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

83 Patents

#137 in Osaka

#1,272 in Japan

#9,158 in the World

Otsuka Electronics Co., Ltd.

Forward Citations = 497

87 inventors:

Kazuaki Ohkubo (13 out of 13 patents)

Tsutomu Mizuguchi (11 out of 11 patents)

Koichi Oka (10 out of 10 patents)

4. Hisashi Shiraiwa (9 out of 9 patents)

5. Kunikazu Taguchi (7 out of 7 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Otsuka Electronics Co., Ltd.. Retrieved from https://idiyas.com/company/otsuka-electronics-company

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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