The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Jun. 22, 2018
Applicant:

Otsuka Electronics Co., Ltd., Hirakata-shi, Osaka, JP;

Inventors:

Yusuke Izutani, Hirakata, JP;

Ikuo Wakayama, Hirakata, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01B 11/08 (2006.01); G01N 15/02 (2006.01); G01N 21/51 (2006.01); G01N 21/53 (2006.01); G01N 21/01 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G01B 11/08 (2013.01); G01N 15/0211 (2013.01); G01N 21/51 (2013.01); G01N 21/53 (2013.01); G01N 2015/03 (2013.01); G01N 2015/1493 (2013.01); G01N 2021/015 (2013.01); G01N 2201/024 (2013.01); G01N 2201/0245 (2013.01);
Abstract

An optical measurement apparatus includes a main body base, an optical base movably combined with the main body base, a measurement optical system fixed to the optical base, and an optical base moving mechanism which moves the optical base relative to the main body base. The optical base moving mechanism moves the optical base relative to the main body base between an internal measurement position and an external measurement position. A measurement object position of the measurement optical system coincides with an internal measurement object position within the main body base. The measurement object position of the measurement optical system coincides with an external measurement object position outside the main body base.


Find Patent Forward Citations

Izutani, Yusuke. (2020). Optical measurement apparatus, and optical measurement method (U.S. Patent No. 10788412). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10788412

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