Hirakata, Japan

Yusuke Izutani

USPTO Granted Patents = 2 

 

Average Co-Inventor Count = 2.4

ph-index = 1


Company Filing History:


Years Active: 2020-2024

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2 patents (USPTO):Explore Patents

Title: Yusuke Izutani: Innovator in Optical Measurement Technology

Introduction

Yusuke Izutani is a notable inventor based in Hirakata, Japan. He has made significant contributions to the field of optical measurement technology, holding a total of 2 patents. His work focuses on developing advanced measuring apparatuses that enhance the accuracy and efficiency of optical measurements.

Latest Patents

Izutani's latest patents include a light scattering measuring apparatus and an optical measurement apparatus. The light scattering measuring apparatus features light sources, a single light receiver, and a sample holder with multiple openings for different measurement types. This innovative design allows for both forward and side measurements, as well as back measurements, by utilizing a moving mechanism to adjust the position of the openings. The optical measurement apparatus consists of a main body base and a movable optical base, which can be adjusted between internal and external measurement positions. This flexibility enables precise measurements of various objects, enhancing the overall functionality of the apparatus.

Career Highlights

Yusuke Izutani is currently employed at Otsuka Electronics Co., Ltd., where he continues to develop cutting-edge technologies in optical measurement. His expertise and innovative approach have positioned him as a key figure in his field.

Collaborations

Izutani has collaborated with notable coworkers, including Ikuo Wakayama and Hiroya Nagasawa. Their combined efforts contribute to the advancement of optical measurement technologies.

Conclusion

Yusuke Izutani's contributions to optical measurement technology through his patents and work at Otsuka Electronics Co., Ltd. highlight his role as an influential inventor in this specialized field. His innovative designs continue to push the boundaries of measurement accuracy and efficiency.

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