The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Nov. 12, 2021
Applicant:

Otsuka Electronics Co., Ltd., Osaka, JP;

Inventors:

Yusuke Izutani, Hirakata, JP;

Ikuo Wakayama, Hirakata, JP;

Hiroya Nagasawa, Hirakata, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/0205 (2024.01);
U.S. Cl.
CPC ...
G01N 15/0211 (2013.01);
Abstract

Provided are a light scattering measuring apparatus. The light scattering measuring apparatus includes: light sources; a single light receiver; a sample holder including a cell, a frame body, a first opening formed in an incident portion of a first optical path used for forward measurement or side measurement, and a second opening formed in an incident portion of a second optical path used for back measurement, and an optical element; and a moving mechanism. The first optical path and the second optical path are separated from each other in vertical direction. The moving mechanism moves the first opening to a position of the incident portion of the first optical path when the forward or side measurement is to be performed, and to move the second opening to a position of the incident portion of the second optical path when the back measurement is to be performed.


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